Recent Posts

X-Ray Inspection and its Effect on NAND Flash Memory

Best Practices for Pre-programming

Monday, March 6, 2017

Download Data I/O's whitepaper and presentation on X-Ray inspection and recommended best practices for preprogramming NAND devices

Whitepaper
X-ray Inspection of Radiation Sensitive Devices
Recommended Best Practices for Preprogramed Managed NAND

Conference Presentation
APEX 2018 - X-ray Inspection of Radiation Sensitive Devices
Recommended Best Practices for Preprogramed Managed NAND

Print

Number of views (13059)

Theme picker

Data I/O Corporation
6645 185th Avenue NE, Suite 100
Redmond, WA 98052 USA

Telephone: +1 425-881-6444
Toll Free in USA: 800-426-1045
FAX: +1 425-867-6972