X-Ray Inspection of Radiation Sensitive Devices
Recommended Best Practices
The rapid growth in automotive flash memory content and the impact of data retention through x-ray inspection has become a topic of discussion amoung automotive electronic suppliers, semiconductor vendors and programming vendors. Data I/O, the leading global supplier of programming solutions and Nordson DAGE, the leading global supplier of automated x-ray inspection systems, teamed up to conduct a joint test study on this topic. Together, the two companies took the results of the study and developed a set of recommended best practices and guidelines to ensure data retention when processing pre-programmed Managed-NAND flash through x-ray inspection. This results of the study and best practices was presented at the IPC APEX Conference and Exhibition.
Preprogramming MLC NAND
Data I/O and a leading semiconductor company developed best practices for reliably programming small lithography MLC NAND devices. Data I/O's Best Practices Guidelines enable customers to achieve the highest quality programming and production yield at low costs while leveraging their existing installed base of equipment and current manufacturing processes.
Data I/O supports the latest NAND devices from leading semiconductor manufacturers including:
To learn more about Data I/O's Best Practice for pre-programming MLC NAND Flash devices, download:
Contact your local Data I/O NAND programming expert to learn how to maximize production yields and reliability with Data I/O's SuperBoost technology, algorithms, adapters and Process Control.