If Session Data Logging has been enabled, after each programming or testing session a record is written to the log file (a line-oriented ASCII file). An example of a TaskLink log file record is shown here.
-------------------------------------------------------
EXAMPLE
------------------------------------------------------
TLWin Session Data Log - Version 5.4.0.1
|
Date Logged: |
09-02-2003 02:12:11 AM |
|
Task Name: |
RR 28F160 |
|
User ID: |
Administrator Mode |
|
System: |
|
|
|
|
|
Device: |
INTEL GT28F160B3TA |
|
Data Source: |
c:\dataio\tlwin\demo.dat |
|
Sumcheck: |
8DBC4954 |
|
Process: |
/Continuity/ID Check/Blank Check/Erase/Program/Verify |
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Process Status: |
Running |
|
TLWin Session ID: |
none |
|
|
|
|
Job Start Time: |
08-19-2004 01:17:26 PM |
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Job End Time: |
08-19-2004 01:22:18 PM |
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Devices Total: |
16 |
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Devices Passed: |
16 |
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Devices Failed: |
0 |
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Overall Device Yield: |
100.00% |
|
|
|
|
Job System ID: |
0010EC0050C2 |
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Job System SW Version: |
Vers 05.09.02.C |
|
Job Algorithm Filename: |
1168410C.ELF |
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Job Algorithm Status: |
Released |
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Job Algorithm Author: |
Data I/O |
|
|
|
|
Job Total Input: |
16 |
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Job Total Output: |
14 |
|
Job Throughput: |
154 |
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Job Programmer Yield: |
100.00 |
|
Adapter Cycle Count: |
0 |
|
|
|
|
Category: |
PASS, CF, NB, IB, PF,VF1,VF2,FT1,FT2,SFF,SFB, DO, EF,EID, OE |
|
TotalStats: |
16, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0 |
|
Skt 1: |
8, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0 |
|
Skt 2: |
8, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0 |
|
Skt 3: |
0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0 |
|
Skt 4: |
0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0, 0 |
--------------------------------------------------------------------------------
The ‘TotalStats’ and Skt1, Skt2, Skt3, Skt4 lines contain comma-delimited information structured in the following format:
|
Field |
Description |
|
PASS |
Devices that successfully programmed |
|
CF |
Devices that failed the continuity test |
|
NB |
Devices that were non-blank prior to programming |
|
IB |
Devices that contained an illegal bit |
|
PF |
Devices that failed the programming operation |
|
VF1 |
Devices that failed during the first verify pass |
|
VF2 |
Devices that failed during the second verify pass |
|
FT1* |
Devices that failed during the first functional test pass |
|
FT2* |
Devices that failed during the second functional test |
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SFF* |
Devices with a security bit that failed to program |
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SFB* |
Devices with a programmed security bit which prevented programming |
|
DO |
Devices with an overcurrent error |
|
EF |
Electrically erasable devices that failed to erase |
|
EID |
Devices with an electronic ID that did not match the selected device type |
|
OE |
Devices that failed due to errors other than those listed above |
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* - Not currently supported by |
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